CFP: Special Session on Reliability of System on Chip (SoC)
5 Octobre 2011
Catégorie : Conférence internationale
Call For Paper for Special Session in ICM 2011 (www.ieee-icm.com).
Special Session : Reliability of System on Chip (SoC) The 23rd International Conference on Microelectronics ICM 2011 (IEEE co-sponsored). Hammamet, Tunisia, 19-22 December 2011.
Submission deadline: Oct 16, 2011.
Call For Paper for Special Session in ICM 2011
The 23rd International Conference on Microelectronics ICM 2011 (IEEE co-sponsored, www.ieee-icm.com) will be held in Hammamet, Tunisia, 19-22 December 2011.
Special Session : Reliability of System on Chip (SoC)
With ever shrinking area and higher-density circuits, the issue of reliability in complex System on Chip (SoC) design is set to become an increasingly challenging issue for researchers as well as for industry. The functioning protection of a SoC from the effects of soft errors is difficult; available solutions often incur significant penalties in area and performance and are still not totally effective. Even when solutions deliver the anticipated error detection facilities, error correction remains hugely complex. Soft errors can be caused by permanent faults (for example collages or mistakes delay) and/or transient faults. They can have internal origin (eg, inductive noise) or external (for example particle impacts: single-event upsets). Today there is a strong need to design methods that define architecture of a SoC as safe as possible against transient faults. The problems of transient faults in the memory are addressed effectively by the use of error correcting codes. The case of transient faults in the logic is more difficult. Two families of approaches are possible: either the redundancy of logic or the detection of transient faults associated with rollback mechanisms.
The Scope of this Special Session includes but not limited to the following aspects:
- Detection of transient faults
- Reliability in reconfigurable systems
- RTOS for reliability of SoC
- Fault tolerance techniques
- Reliability and failure analysis
- Reliability Management
- Checkpointing/Recovery in embedded systems
- Paper submission deadline: October 16, 2011
- Author notification: November 5, 2011
- Camera Ready submission: November 25, 2011