Interfacing Bayesian statistics, machine learning, and mathematical analysis for blind and semi-blind imaging inverse problems

25 Novembre 2022

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Catégorie : Conférence internationale

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This 3-day workshop will focus on interactions between Bayesian statistics, machine learning, and applied analysis, in the context of imaging sciences, with special attention to imaging inverse problems that are blind or semi-blind. The aim is to bring together a group of world-leading experts and rising early career researchers to discuss recent developments in these fields and open challenges, with a focus on ideas that develop at the fertile interface where the three frameworks meet. We have decided to structure the workshop around small topical poster sessions and to have one 2-hour tutorial each morning. This structure allows all participants to have plenty of time for discussion between participants and there will be space for you to sit down, chat, and work.

You can find more information about this workshop and instructions to apply in the link below.

https://www.icms.org.uk/workshops/2023/interfacing-bayesian-statistics-machine-learning-applied-analysis-and-blind-and-semi

The workshop is kindly supported by the UK research council EPSRC, via the EPSRC projects "Bayesian model selection and calibration for computational imaging" (EP/T007346/1) and "Learned Exascale Computational Imaging" (EP/W007673/1, EP/W007681/1).

Best wishes,
Marcelo Pereyra, Jean-François Giovannelli, and Valentin De Bortoli